In tapping-mode atomic-force microscopy usually amplitude and phase of the cantilever
motion are acquired. These signals are related to the fundamental oscillation frequency …

We present an experimental analysis of the nonlinear tip–sample interaction in tapping-
mode atomic-force microscopy by exploiting anharmonic contributions of the cantilever …

Higher harmonics in tapping-mode atomic force microscopy offers the potential for imaging
and sensing material properties at the nanoscale. The signal level at a given harmonic of the …

In tapping-mode atomic force microscopy, nonlinear tip–sample interactions give rise to
higher harmonics of the cantilever vibration. We present an electrical circuit to model the …

Dynamic atomic force microscopy (AFM) is a standard technique for imaging and the
analysis of surfaces at the nanometre scale. In order to estimate material properties from the …

The natural frequencies of a cantilever probe can be tuned with an attached concentrated
mass to coincide with the higher harmonics generated in a tapping-mode atomic force …

By spectroscopic analysis of the cantilever oscillation in tapping-mode atomic-force
microscopy (TM–AFM), we demonstrate that the transition from an oscillatory state …

We present a micromachined scanning probe cantilever, in which a specific higher-order
flexural mode is designed to be resonant at an exact integer multiple of the fundamental …

In amplitude modulation atomic force microscopy the attractive and the repulsive force
regimes induce phase shifts above and below 90, respectively. In the more recent …

In typical dynamic mode operation of atomic force microscopes, steady state signals like
amplitude and phase are used for detection and imaging of material. In these methods, the …