Continuous wave terahertz spectrometer as a noncontact thickness measuring device

R Wilk, F Breitfeld, M Mikulics, M Koch - Applied Optics, 2008 - opg.optica.org
We present a low cost terahertz (THz) spectrometer with coherent detection based on two
simple and robust dipole antennas driven by two laser diodes. The spectrometer covers …

Multifrequency continuous wave terahertz spectroscopy for absolute thickness determination

M Scheller, K Baaske, M Koch - Applied Physics Letters, 2010 - pubs.aip.org
We present a tunable multifrequency continuous wave terahertz spectrometer based on two
laser diodes, photoconductive antennas, and a coherent detection scheme. The system is …

Fastest thickness measurements with a terahertz time-domain system based on electronically controlled optical sampling

M Yahyapour, A Jahn, K Dutzi, T Puppe, P Leisching… - Applied Sciences, 2019 - mdpi.com
Featured Application Terahertz thickness gauging of polymers and paint layers; one-
hundred percent inspection of plastic pipes; process control. Abstract We apply a fast …

Multilayer thickness determination using continuous wave THz spectroscopy

D Stanze, B Globisch, RJB Dietz… - IEEE Transactions …, 2014 - ieeexplore.ieee.org
We present a multilayer thickness measurement system based on optoelectronic continuous
wave THz spectroscopy. Due to its wide tuning range, high frequency resolution, and fast …

Simple and cost-effective thickness measurement terahertz system based on a compact 1.55 μm λ/4 phase-shifted dual-mode laser

HC Ryu, N Kim, SP Han, H Ko, JW Park, K Moon… - Optics …, 2012 - opg.optica.org
A simple thickness measurement method based on the coherent homodyne CW THz system
was demonstrated; it does not require precise control of the frequencies of the beat source …

Terahertz thickness determination with interferometric vibration correction for industrial applications

T Pfeiffer, S Weber, J Klier, S Bachtler, D Molter… - Optics …, 2018 - opg.optica.org
In many industrial fields, like automotive and painting industry, the thickness of thin layers is
a crucial parameter for quality control. Hence, the demand for thickness measurement …

Sample thickness measurement with THz-TDS: Resolution and implications

CY Jen, C Richter - Journal of Infrared, Millimeter, and Terahertz Waves, 2014 - Springer
The accuracy of any measurement with terahertz time-domain spectroscopy (THz-TDS)
depends strongly on knowing and supplying the precise sample thickness when processing …

Terahertz probe for spectroscopy of sub-wavelength objects

O Mitrofanov, CC Renaud, AJ Seeds - Optics express, 2012 - opg.optica.org
A system of two probes is designed for terahertz (THz) time-domain spectroscopy of sub-
wavelength size objects. A twin-needle probe confines broadband THz pulses spatially by …

Fast and accurate thickness determination of unknown materials using terahertz time domain spectroscopy

M Scheller, M Koch - Journal of Infrared, Millimeter, and Terahertz Waves, 2009 - Springer
We present a fast and accurate time domain based algorithm which extracts simultaneously
the thickness and refractive index of highly transparent samples from terahertz time domain …

Inline multilayer thickness sensing by using terahertz time-domain spectroscopy in reflection geometry

S Krimi, J Klier, M Herrmann… - … Waves (IRMMW-THz …, 2013 - ieeexplore.ieee.org
We present a novel approach to determine the individual layer thickness in a dielectric
multilayer sample using pulsed terahertz spectroscopy in reflection geometry. In a first step …