Tapping mode atomic force microscopy (AFM), also known as amplitude modulated (AM) or
AC mode, is a proven, reliable, and gentle imaging mode with widespread applications …

During dynamic atomic force microscopy (AFM), the deflection of a scanning cantilever
generates multiple frequency terms due to the nonlinear nature of AFM tip–sample …

Amplitude-modulated (AM) atomic force microscopy (AFM), also known as tapping or AC
mode, is a proven, reliable, and gentle imaging method with widespread applications …

Fast, high-resolution mapping of heterogeneous interfaces with a wide elastic modulus
range is a major goal of atomic force microscopy (AFM). This goal becomes more …

Quantifying the tip–sample interaction forces in amplitude-modulated atomic force
microscopy (AM-AFM) has been an elusive yet important goal in nanoscale imaging …

Filling a gap in the literature, this book features in-depth discussions on amplitude
modulation AFM, providing an overview of the theory, instrumental considerations and …

High spatial resolution imaging of material properties is an important task for the continued
development of nanomaterials and studies of biological systems. Time-varying interaction …

Stiffness matching between the probe and deformed portion of the sample in piezo-drive
peak force modulation atomic force microscopy (AFM) limits the modulus measurement …

We present an overview of the bimodal amplitude–frequency-modulation (AM-FM) imaging
mode of atomic force microscopy (AFM), whereby the fundamental eigenmode is driven by …

Atomic force microscope (AFM) cantilevers with integrated actuation and sensing provide
several distinct advantages over conventional cantilever instrumentation. These include …