Mechanism of hydrogen-induced crystallization of amorphous silicon

S Sriraman, S Agarwal, ES Aydil, D Maroudas - Nature, 2002 - nature.com
Hydrogenated amorphous and nanocrystalline silicon films manufactured by plasma
deposition techniques are used widely in electronic and optoelectronic devices,. The …

Bond selectivity in silicon film growth

JJ Boland, GN Parsons - Science, 1992 - science.org
Hydrogen atoms can selectively eliminate strained bonds that form during the growth of
amorphous silicon films. By periodically interrupting the growth and exposing the grown …

Hydrogen microstructure in amorphous hydrogenated silicon

KK Gleason, MA Petrich, JA Reimer - Physical Review B, 1987 - APS
Using nuclear magnetic resonance (NMR) and infrared (ir) absorption spectroscopy, this
paper demonstrates the effects of deposition temperature, annealing temperature, and …

Electric-field-enhanced crystallization of amorphous silicon

J Jang, JY Oh, SK Kim, YJ Choi, SY Yoon, CO Kim - Nature, 1998 - nature.com
Thin films of polycrystalline silicon are of great importance for large-area electronic
applications, providing, for example, the switching electronics in many flat-panel displays …

Hydrogen chemical potential and structure of a-Si:H

RA Street - Physical Review B, 1991 - APS
It is proposed that the chemical equilibrium of hydrogen is an important factor in determining
the structure of thin films deposited from silane-hydrogen plasmas. Hydrogen interacts with …

Defect formation during growth of hydrogenated amorphous silicon

G Ganguly, A Matsuda - Physical Review B, 1993 - APS
The defects believed to limit the performance of devices fabricated using hydrogenated
amorphous silicon are identified as singly occupied dangling bonds. The formation of these …

Device-quality polycrystalline and amorphous silicon films by hot-wire chemical vapour deposition

REI Schropp, KF Feenstra, EC Molenbroek… - Philosophical …, 1997 - Taylor & Francis
We describe how high-quality intrinsic hydrogenated amorphous silicon (a-Si: H), as well as
purely intrinsic single-phase hydrogenated polycrystalline silicon (poly-Si: H), can be …

Relative importance of the Si–Si bond and Si–H bond for the stability of amorphous silicon thin film transistors

RB Wehrspohn, SC Deane, ID French, I Gale… - Journal of Applied …, 2000 - pubs.aip.org
We investigate the mechanism for Si dangling bond defect creation in amorphous silicon
thin film transistors as a result of bias stress. We show that the rate of defect creation does …

Structural, defect, and device behavior of hydrogenated amorphous Si near and above the onset of microcrystallinity

S Guha, J Yang, DL Williamson, Y Lubianiker… - Applied Physics …, 1999 - pubs.aip.org
High-hydrogen-diluted films of hydrogenated amorphous Si (a-Si: H) 0.5 μm in thickness
and optimized for solar cell efficiency and stability, are found to be partially microcrystalline …

Hydrogen plasma enhanced crystallization of hydrogenated amorphous silicon films

K Pangal, JC Sturm, S Wagner… - Journal of Applied …, 1999 - pubs.aip.org
Polycrystalline silicon polysilicon is used extensively in the fabrication of thin film transistors
TFTs. Polysilicon formed by the crystallization of amorphous silicon (a-Si) has far superior …