Multifrequency atomic force microscopy (AFM) utilizes the multimode operation of
cantilevers to achieve rapid high-resolution imaging and extract multiple properties …

The wide application of multi-frequency atomic force microscopy (AFM) places higher
demands on the higher-order modes response of the cantilever. The response of the higher …

During dynamic atomic force microscopy (AFM), the deflection of a scanning cantilever
generates multiple frequency terms due to the nonlinear nature of AFM tip–sample …

In this work, we study the performance of a new cantilever design during multi-frequency
tapping mode Atomic Force Microscopy (AFM). The system consists of a base cantilever with …

Microcantilevers are at the heart of atomic force microscopy (AFM) and play a significant role
in AFM‐based techniques. Recent advancements in multifrequency AFM require the …

Multi-frequency atomic force microscopy (MF-AFM), employing the detection and/or
excitation of multiple cantilever frequencies, has shown great promise in increasing the …

Multifrequency atomic force microscopy is a powerful nanoscale imaging and
characterization technique that involves excitation of the atomic force microscope (AFM) …

The advancement of dynamic and multifrequency atomic force microscopy (AFM)
necessitates leveraging the frequency response of cantilevers when it is in contact with the …

Precise analysis of substance through multifrequency atomic force microscope (MF-AFM) is
a major challenge for fundamental research. In this article, a coupled symmetrical MF-AFM …

Detecting and characterizing nanoscale material properties and functionalities of samples
and emerging devices is of rapidly growing interest in nano-and bio-technologies. We …