We developed a multi-probe atomic force microscope (MP-AFM) system with up to four
probes and realized various functions such as topography mapping, probing electrical …

We developed a multi-probe atomic force microscope (AFM) having two AFM cantilevers
independently controlled using the optical beam deflection method. We succeeded in …

We developed a dual-probe atomic force microscopy (DP-AFM) system with two cantilever
probes that can be operated in various environments such as in air, vacuum, and liquid. The …

A novel atomic force microscope (AFM) has been developed. Unlike conventional AFM
systems, its cantilever and tip were set up in the X direction with respect to the sample. It can …

The atomic force microscopy (AFM) is a very important tool for imaging and investigating the
complex force interactions on sample surfaces with high spatial resolution. In the AFM, two …

We present a novel thin head atomic force microscope (AFM) that can be easily integrated
with an upright optical microscope (OM). The optical beam detection unit in the AFM used an …

A high-speed atomic force microscope (HS-AFM) based on a tip-sample combined scanning
architecture is presented. In this system, the X-scanner, which is separated from the AFM …

We developed a dual-probe (DP) atomic force microscopy (AFM) system that has two
independently controlled probes. The deflection of each cantilever is measured by the …

In atomic force microscopy (AFM), the exchange and alignment of the AFM cantilever with
respect to the optical beam and position-sensitive detector (PSD) are often performed …

The stationary-sample (scanning-probe)-type atomic force microscope (AFM) has been
demonstrated to have many advantages over its conventional counterpart: the scanning …