A compact high-speed X-ray atomic force microscope has been developed for in situ use in
normal-incidence X-ray experiments on synchrotron beamlines, allowing for simultaneous …

Micro-focused X-ray beams produced by third generation synchrotron sources offer new
perspective of studying strains and processes at nanoscale. Atomic force microscope setup …

The in situ combination of Scanning Probe Microscopies with X-ray microbeams adds a
variety of new possibilities to the panoply of synchrotron radiation techniques. This paper …

A compact scanning force microscope has been developed for in situ combination with
nanofocused X-ray diffraction techniques at third-generation synchrotron beamlines. Its …

We report on the design and first tests of a novel instrument aimed at combining the benefits
of scanning force microscopy with those of X-ray spectroscopy. For this we built an …

We developed and optimised an optics‐free Atomic Force Microscope (AFM) that can be
directly installed on most of the synchrotron radiation end‐stations. The combination of …

A combined x-ray transmission and scanning force microscope setup (NanoXAS) recently
installed at a dedicated beamline of the Swiss Light Source combines complementary …

The planned Center for Nanoscale Materials (CNM) at Argonne National Laboratory is
aimed at the development and study of the properties of nanomaterials and nanodevices. As …

The advent of nanofocused X-ray beams has allowed the study of single nanocrystals and
complete nanoscale devices in a nondestructive manner, using techniques such as …

A mapping technique has been developed where a sub-micrometer focused polychromatic
X-ray beam is scanned across a stationary sample instead of scanning the sample in front of …