We proposed the integration of metasurfaces on atomic force microscopy (AFM) cantilevers
to improve the optical lever sensitivity. The metasurface positioned at the back of an AFM …

In this contribution, we present the application of an optical metasurface polarization rotator
in an Atomic Force Microscopy (AFM) setup. In AFM, the laser beam used to measure the …

A method is presented to enhance the optical lever sensitivity in dynamic atomic force
microscopy (AFM) by nearly an order of magnitude over a wide frequency bandwidth. This is …

The mechanism of dynamic force modes has been successfully applied to many atomic
force microscopy (AFM) applications, such as tapping mode and phase imaging. The high …

The advancement of dynamic and multifrequency atomic force microscopy (AFM)
necessitates leveraging the frequency response of cantilevers when it is in contact with the …

A new type of horizontal atomic force microscope (AFM) is developed for applications in
nanotechnology. This article provides the basic principle and setup of the horizontal AFM …

Characterizations of nano-scale structures using conventional stylus profilometer and optical
microscopy are respectively restricted by tip radius and diffraction limit. Atomic force …

To enhance contact resonance atomic force microscopy (CR-AFM) and harmonic AFM
imaging simultaneously, we design a multifunctional cantilever. Precise tailoring of the …

Optical beam deflection systems are widely used in cantilever based atomic force
microscopy (AFM). Most commercial cantilevers have a reflective metal coating on the …

A novel method that uses a small mechanical lever has been developed to directly calibrate
the lateral sensitivity of the optical lever in the atomic force microscope (AFM). The …