We present a novel approach to determine the individual layer thickness in a dielectric
multilayer sample using pulsed terahertz spectroscopy in reflection geometry. In a first step …

In terahertz spectroscopy, multi-layered samples often need to be measured, for instance in
a liquid flow cell, and this complicates the extraction of material parameters. We present a …

We present a multilayer thickness measurement system based on optoelectronic continuous
wave THz spectroscopy. Due to its wide tuning range, high frequency resolution, and fast …

Nowadays, aircrafts and cars are coated with several layers of coating. Hence, demands for
thickness monitoring of each individual layer within a multi-layer coating system are rising …

The quality of coatings in industrial applications and scientific research with thicknesses in
the micrometer range is an important criterion for quality management. Therefore, thickness …

A bstract We compare a state-of-the-art terahertz (THz) time domain spectroscopy (TDS)
system and a novel optoelectronic frequency domain spectroscopy (FDS) system with …

For a bi-layer structure consisting of a film deposited on a substrate, a new extraction
method is proposed using which we can extract both the material parameters of the film and …

We present a low cost terahertz (THz) spectrometer with coherent detection based on two
simple and robust dipole antennas driven by two laser diodes. The spectrometer covers …

We report on the layer thickness determination on dielectrically coated metal cylinders using
terahertz (THz) time-domain spectroscopy. A considerable sensitivity increase of up to a …

There is a minimum measurable thickness when gauging micron-level coating films with
time-of-flight based terahertz thickness measurement technologies. To improve this …