The atomic force microscope (AFM) is a tool that enables the measurement of precisely
localized forces with unprecedented resolution in time, space and force. At the heart of this …

The performance of the atomic force microscope (AFM) is underpinned by the properties of
its force-sensing microcantilever. Due to the universal belief that V-shaped cantilevers are …

We present here a method to calibrate the lateral force in the atomic force microscope. This
method makes use of an accurately calibrated force sensor composed of a tipless …

The atomic force microscope (AFM) can provide qualitative information by numerous
imaging modes, but it can also provide quantitative information when calibrated cantilevers …

There are many atomic force microscopy (AFM) applications that rely on quantifying the
force between the AFM cantilever tip and the sample. The AFM does not explicitly measure …

A methodology is developed to reconstruct the force applied to an atomic force microscopy
(AFM) cantilever given the shape in which it vibrates. This is accomplished by rewriting …

We describe the design, fabrication, and calibration testing of a new piezoresistive cantilever
force sensor suitable for the force calibration of atomic force microscopes in a range …

A common use of atomic force microscopy is quantifying local forces through tip-sample
interactions between the probe tip and a sample surface. The accuracy of these …

Piezoelectric actuation of atomic force microscope (AFM) cantilevers often suffers from
spurious mechanical resonances in the loop between the signal driving the cantilever and …

In atomic force microscopy (AFM), typically the cantilever's long axis forms an angle with
respect to the plane of the sample's surface. This has consequences for contact mode …