Force studies using atomic force microscopy generally require knowledge of the cantilever
spring constants and the optical lever sensitivity. The traditional method of evaluating the …

Atomic force microscopes typically require knowledge of the cantilever spring constant and
optical lever sensitivity in order to accurately determine the force from the cantilever …

Accurate force determinations in atomic force microscopy require the precise measurement
of cantilever deflections. A limiting factor in making these measurements is the calibration of …

A novel method that uses a small mechanical lever has been developed to directly calibrate
the lateral sensitivity of the optical lever in the atomic force microscope (AFM). The …

Proper force calibration is a critical step in atomic and lateral force microscopies (AFM/LFM).
The recently published torsional Sader method [CP Green et al, Rev. Sci. Instrum. 75, 1988 …

Calibration of lateral forces and displacements has been a long standing problem in lateral
force microscopies. Recently, it was shown by Wagner et al. that the thermal noise spectrum …

We have designed and tested a new, inexpensive, easy-to-make and easy-to-use
calibration standard for atomic force microscopy (AFM) lateral force measurements. This …

We present here a method to calibrate the lateral force in the atomic force microscope. This
method makes use of an accurately calibrated force sensor composed of a tipless …

Quantitative force measurements performed using the atomic force microscope (AFM)
inherently rely on calibration of the AFM cantilever spring constant to convert the measured …

The atomic force microscope can provide information on the atomic‐level frictional
properties of surfaces, but reproducible quantitative measurements are difficult to obtain …