In atomic force microscopy (AFM), typically the cantilever's long axis forms an angle with
respect to the plane of the sample's surface. This has consequences for contact mode …

This paper presents a method and cantilever design for improving the mechanical
measurement sensitivity in the atomic force microscopy (AFM) tapping mode. The method …

Quantitative force measurements performed using the atomic force microscope (AFM)
inherently rely on calibration of the AFM cantilever spring constant to convert the measured …

The control of tip-to-sample distance in atomic force microscopy (AFM) is achieved through
controlling the vertical tip position of the AFM cantilever. In the vertical tip-position control …

It has long been recognized that the angular deflection of an atomic force microscope (AFM)
cantilever under “normal” loading conditions can be profoundly influenced by the friction …

The atomic force microscope (AFM) system has evolved into a useful tool for direct
measurements of intermolecular forces with atomic-resolution characterization that can be …

Cantilevers for atomic force microscopy AFM have found widespread use in high-resolution
imaging, force measurement, chemical-and biosensors, and measurement of local …

Due to the harmonic motion of the cantilever in Tapping Mode Atomic Force Microscopy, it is
seemingly impossible to estimate the tip-sample interactions from the motion of the …

The atomic force microscope AFM is a powerful instrument in nanometer-scale science and
technology. Since its invention in 1986, 1 AFM has evolved significantly, refining its …

The atomic force microscope can provide information on the atomic‐level frictional
properties of surfaces, but reproducible quantitative measurements are difficult to obtain …