High speed imaging and mapping of nanomechanical properties in atomic force microscopy
(AFM) allows the observation and characterization of dynamic sample processes. Recent …

Dynamic atomic force microscopy (AFM) is a standard technique for imaging and the
analysis of surfaces at the nanometre scale. In order to estimate material properties from the …

During dynamic atomic force microscopy (AFM), the deflection of a scanning cantilever
generates multiple frequency terms due to the nonlinear nature of AFM tip–sample …

Increasing the signal-to-noise ratio in dynamic atomic force microscopy plays a key role in
nanomechanical mapping of materials with atomic resolution. In this work, we develop an …

Higher harmonics in tapping-mode atomic force microscopy offers the potential for imaging
and sensing material properties at the nanoscale. The signal level at a given harmonic of the …

Multifrequency atomic force microscopy imaging has been recently demonstrated as a
powerful technique for quickly obtaining information about the mechanical properties of a …

In atomic force microscopy, a force-sensing cantilever probes a sample and thereby creates
a topographic image of its surface. The simplest implementation uses the static deflection of …

Small cantilevers with ultra-high resonant frequencies (1–3 MHz) have paved the way for
high-speed atomic force microscopy. However, their potential for multi-frequency atomic …

In atomic force microscopy, a force-sensing cantilever probes a sample and thereby creates
a topographic image of its surface. The simplest implementation uses the static deflection of …

We present an overview of the bimodal amplitude–frequency-modulation (AM-FM) imaging
mode of atomic force microscopy (AFM), whereby the fundamental eigenmode is driven by …