Amplitude-modulated (AM) atomic force microscopy (AFM), also known as tapping or AC
mode, is a proven, reliable, and gentle imaging method with widespread applications …

Since its invention, amplitude-modulation tapping-mode atomic force microscopy (AM-AFM)
has rapidly developed into a common high-resolution surface characterization tool …

The AFM has long been recognized for its ability to either image surfaces at the nanoscale,
or to determine mechanical properties at the nanoscale. However, until recently, the …

Tapping mode atomic force microscopy (AFM), also known as amplitude modulated (AM) or
AC mode, is a proven, reliable, and gentle imaging mode with widespread applications …

Since the 1980s, atomic force microscopy (AFM) has rapidly developed into a versatile, high-
resolution characterization technique, available in a variety of imaging modes. Within …

The acquisition of high resolution images in atomic force microscopy (AFM) is correlated to
the cantilever's tip shape, size, and imaging conditions. In this work, relative tip wear is …

The cantilever excitation frequency and tip free oscillation amplitude are two critical imaging
parameters in amplitude-modulation atomic force microscopy (AM-AFM, often referred to as …

Filling a gap in the literature, this book features in-depth discussions on amplitude
modulation AFM, providing an overview of the theory, instrumental considerations and …

Amplitude modulation atomic force microscopy (AM-AFM) is one of the most popular AFM
modes because of the reduced tip–sample interaction, compared to contact mode AFM, and …

An expression for loss tangent measurement of a surface in amplitude modulation atomic
force microscopy is derived using only the cantilever phase and the normalized cantilever …