Inner-paddled atomic force microscopy cantilever for rapid mechanical mapping
X Yang, C Ma, X Wang, C Zhou - Sensors and Actuators A: Physical, 2023 - Elsevier
Mechanical characterization methods at the nanoscale are of critical importance for many
fields including nanomaterials, micro/nano devices and nanomechanics. As a key tool in …
fields including nanomaterials, micro/nano devices and nanomechanics. As a key tool in …
Vibrational shape tracking of atomic force microscopy cantilevers for improved sensitivity and accuracy of nanomechanical measurements
Contact resonance atomic force microscopy (CR-AFM) methods currently utilize the
eigenvalues, or resonant frequencies, of an AFM cantilever in contact with a surface to …
eigenvalues, or resonant frequencies, of an AFM cantilever in contact with a surface to …
Atomic force microscopy for nanoscale mechanical property characterization
Over the past several decades, atomic force microscopy (AFM) has advanced from a
technique used primarily for surface topography imaging to one capable of characterizing a …
technique used primarily for surface topography imaging to one capable of characterizing a …
Optimizing The Laser Spot Positioning on Tailored Microcantilevers Used in Atomic Force Microscopy
G Bhattacharya, I Lionadi, J Ward… - IEEE Transactions on …, 2024 - ieeexplore.ieee.org
The advancement of dynamic and multifrequency atomic force microscopy (AFM)
necessitates leveraging the frequency response of cantilevers when it is in contact with the …
necessitates leveraging the frequency response of cantilevers when it is in contact with the …
Multimodal atomic force microscopy with optimized higher eigenmode sensitivity using on-chip piezoelectric actuation and sensing
Atomic force microscope (AFM) cantilevers with integrated actuation and sensing provide
several distinct advantages over conventional cantilever instrumentation. These include …
several distinct advantages over conventional cantilever instrumentation. These include …
Multifunctional cantilevers for simultaneous enhancement of contact resonance and harmonic atomic force microscopy
W Wang, K Zhang, W Zhang, Y Hou, Y Chen - Nanotechnology, 2021 - iopscience.iop.org
To enhance contact resonance atomic force microscopy (CR-AFM) and harmonic AFM
imaging simultaneously, we design a multifunctional cantilever. Precise tailoring of the …
imaging simultaneously, we design a multifunctional cantilever. Precise tailoring of the …
Time-resolved tapping-mode atomic force microscopy
AF Sarioglu, O Solgaard - Scanning Probe Microscopy in Nanoscience …, 2010 - Springer
Atomic force microscopy has unprecedented potential for quantitative mapping of material-
specific surface properties on the nanoscale. Unfortunately, methods developed for local …
specific surface properties on the nanoscale. Unfortunately, methods developed for local …
Multi-frequency Atomic Force Microscopy based on enhanced internal resonance of an inner-paddled cantilever
In this work, we study the performance of a new cantilever design during multi-frequency
tapping mode Atomic Force Microscopy (AFM). The system consists of a base cantilever with …
tapping mode Atomic Force Microscopy (AFM). The system consists of a base cantilever with …
[HTML][HTML] Modular apparatus for electrostatic actuation of common atomic force microscope cantilevers
CJ Long, RJ Cannara - Review of Scientific Instruments, 2015 - pubs.aip.org
Piezoelectric actuation of atomic force microscope (AFM) cantilevers often suffers from
spurious mechanical resonances in the loop between the signal driving the cantilever and …
spurious mechanical resonances in the loop between the signal driving the cantilever and …
Fast, high resolution, and wide modulus range nanomechanical mapping with bimodal tapping mode
Tapping mode atomic force microscopy (AFM), also known as amplitude modulated (AM) or
AC mode, is a proven, reliable, and gentle imaging mode with widespread applications …
AC mode, is a proven, reliable, and gentle imaging mode with widespread applications …