Since the 1980s, atomic force microscopy (AFM) has rapidly developed into a versatile, high-
resolution characterization technique, available in a variety of imaging modes. Within …

Since its invention, amplitude-modulation tapping-mode atomic force microscopy (AM-AFM)
has rapidly developed into a common high-resolution surface characterization tool …

Increasing the imaging speed of tapping mode atomic force microscopy (AFM) has important
practical and scientific applications. The scan speed of tapping-mode AFMs is limited by the …

In tapping mode atomic force microscopy (AFM), a cantilever is driven near its resonance
frequency and intermittently strikes the sample while raster scanned across a surface. The …

A new intermittent-contact atomic force microscopy (AFM) mode (frequency and force
modulation AFM, FFM-AFM) has been recently proposed to characterize soft samples. This …

High speed atomic force microscopy enables observation of dynamic nano-scale processes.
However, maintaining a minimal interaction force between the sample and the probe is …

Tapping mode atomic force microscopy (AFM) provides phase images in addition to height
and amplitude images. Although the behavior of tapping mode AFM has been investigated …

In this paper, a software-hardware integrated approach is proposed for high-speed, large-
range tapping mode imaging of atomic force microscope (AFM). High speed AFM imaging is …

Abstract In Atomic Force Microscopy (AFM), the dynamics and non-linearities of the
positioning stage are major sources of image artifacts and distortion, especially when …

We present an experimental analysis of the nonlinear tip–sample interaction in tapping-
mode atomic-force microscopy by exploiting anharmonic contributions of the cantilever …