Etching of scandium-doped aluminum nitride using inductively coupled plasma dry etch and tetramethyl ammonium hydroxide

ASMZ Shifat, I Stricklin, RK Chityala, A Aryal, G Esteves… - MRS Advances, 2023 - Springer
Abstract Properties such as wide bandgap, higher electromechanical coupling, and low
dielectric permittivity have propelled Sc x Al1− x N as an advantageous material for …

Vertical etching of scandium aluminum nitride thin films using TMAH solution

ASMZ Shifat, I Stricklin, RK Chityala, A Aryal, G Esteves… - Nanomaterials, 2023 - mdpi.com
A wide bandgap, an enhanced piezoelectric coefficient, and low dielectric permittivity are
some of the outstanding properties that have made Sc x Al 1− x N a promising material in …

Thermal atomic layer etching of crystalline aluminum nitride using sequential, self-limiting hydrogen fluoride and Sn (acac) 2 reactions and enhancement by H2 and Ar …

NR Johnson, H Sun, K Sharma… - Journal of Vacuum …, 2016 - pubs.aip.org
Thermal atomic layer etching (ALE) of crystalline aluminum nitride (AlN) films was
demonstrated using sequential, self-limiting reactions with hydrogen fluoride (HF) and tin (II) …

[PDF][PDF] Vertical Etching of Scandium Aluminum Nitride Thin Films Using TMAH Solution. Nanomaterials 2023, 13, 274

A Shifat, I Stricklin, RK Chityala, A Aryal, G Esteves… - 2023 - academia.edu
A wide bandgap, an enhanced piezoelectric coefficient, and low dielectric permittivity are
some of the outstanding properties that have made ScxAl1− xN a promising material in …

Highly selective dry etching of III nitrides using an inductively coupled plasma

JM Lee, KM Chang, IH Lee, SJ Park - Journal of Vacuum Science & …, 2000 - pubs.aip.org
The selective etch characteristics of GaN, Al x Ga 1− x N, and In x Ga 1− x N have been
examined in an inductively coupled plasma reactor using Cl 2/Ar/O 2 as the etchant gas …

Smooth etching of epitaxially grown AlN film by Cl2/BCl3/Ar-based inductively coupled plasma

X Liu, C Sun, B Xiong, L Niu, Z Hao, Y Han, Y Luo - Vacuum, 2015 - Elsevier
Inductively coupled plasma dry etching of epitaxially grown aluminum nitride (AlN) film using
Cl 2/BCl 3/Ar mixture has been investigated. The etch rate of AlN increases significantly with …

Isotropic plasma-thermal atomic layer etching of aluminum nitride using SF6 plasma and Al (CH3) 3

H Wang, A Hossain, D Catherall… - Journal of Vacuum …, 2023 - pubs.aip.org
We report the isotropic plasma atomic layer etching (ALE) of aluminum nitride using
sequential exposures of SF 6 plasma and trimethylaluminum [Al (CH 3) 3]. ALE was …

Epitaxial ScAlN etch-stop layers grown by molecular beam epitaxy for selective etching of AlN and GaN

MT Hardy, BP Downey, DJ Meyer… - IEEE Transactions …, 2017 - ieeexplore.ieee.org
Although selective dry etches exist for GaN, it is difficult to selectively etch AlN in
heterostructures with other conventional III-N epitaxial materials. The reduction in etch rate …

[HTML][HTML] High-fidelity patterning of AlN and ScAlN thin films with wet chemical etching

K Airola, S Mertin, J Likonen, E Hartikainen, K Mizohata… - Materialia, 2022 - Elsevier
We report on the anisotropic wet etching of sputtered AlN and Sc 0.2 Al 0.8 N thin films. With
tetramethyl ammonium hydroxide at 80° C, the etch rates along the c-axis were 330 and 30 …

Etch Mechanism of AlN Thin Film in Cl2/Ar Inductively Coupled Plasma

JC Woo, DP Kim, GH Kim - Transactions on Electrical and Electronic …, 2022 - Springer
The etching characteristics of aluminum nitride (AlN) were investigated with the etch rate of
AlN thin film and the selectivity of AlN to SiO2 in an inductively coupled Cl2/Ar plasma. The …