We developed a dual-probe (DP) atomic force microscopy (AFM) system that has two
independently controlled probes. The deflection of each cantilever is measured by the …

We developed a dual-probe atomic force microscopy (DP-AFM) system with two cantilever
probes that can be operated in various environments such as in air, vacuum, and liquid. The …

We developed a multi-probe atomic force microscope (MP-AFM) system with up to four
probes and realized various functions such as topography mapping, probing electrical …

We developed a multi-probe atomic force microscopy (AFM) system using piezoelectric thin
film (PZT) cantilevers. The use of self-sensing cantilevers with integrated deflection sensors …

The atomic force microscope AFM is a powerful instrument in nanometer-scale science and
technology. Since its invention in 1986, 1 AFM has evolved significantly, refining its …

An atomic force microscope with a stationary sample and a scanning cantilever using an
optical lever method is demonstrated for the first time. The cantilever tip is translated to …

We developed a multi-probe atomic force microscope (AFM) having two AFM cantilevers
independently controlled using the optical beam deflection method. We succeeded in …

The atomic force microscopy (AFM) is a very important tool for imaging and investigating the
complex force interactions on sample surfaces with high spatial resolution. In the AFM, two …

We present a method for measuring the deflection of the optical beam in an atomic force
microscope (AFM) that yields an increased signal-to-noise ratio, compared to the …

Most atomic force microscopes employ the optical lever deflection method using a quadrant
photodetector as the displacement sensor of the cantilever, which enables it to detect lateral …