High spatial resolution imaging of material properties is an important task for the continued
development of nanomaterials and studies of biological systems. Time-varying interaction …

Tapping-mode atomic force microscopy (AFM), in which the vibrating tip periodically
approaches, interacts and retracts from the sample surface, is the most common AFM …

Multifrequency atomic force microscopy imaging has been recently demonstrated as a
powerful technique for quickly obtaining information about the mechanical properties of a …

Torsional harmonic cantilevers allow measurement of time-varying tip-sample forces in
tapping-mode atomic force microscopy. Accuracy of these force measurements is important …

Dynamic atomic force microscopy, in essence, consists of a vibrating microcantilever with a
nanoscale tip that interacts with a sample surface via short-and long-range intermolecular …

We present a method to reconstruct the nonlinear tip-surface force and extract material
properties from a multifrequency atomic force microscopy (AFM) measurement with a high …

Abstract Knowledge of surface forces is the key to understanding a large number of
processes in fields ranging from physics to material science and biology. The most common …

Recently developed sub-resonance tapping modes (such as Digital Pulse, Peak Force
Tapping, HybriD, etc.) of atomic force microscopy (AFM) allow imaging of compositional …

Direct time-varying tip-sample force measurements by torsional harmonic cantilevers
facilitate detailed investigations of the cantilever dynamics in tapping-mode atomic force …

The atomic force microscope (AFM) system has evolved into a useful tool for direct
measurements of micro-structural parameters and unraveling the intermolecular forces at …