In atomic force microscopy (AFM), high-frequency components consisted in dynamic tip-
sample interaction have been recently demonstrated as a promising technique for exploring …

In atomic force microscopy (AFM), the higher modes are highly sensitive to the tip-sample
interactions which generate many harmonics. When a higher harmonic is close to the …

Higher-harmonics generation in a tapping-mode atomic force microscope is a consequence
of the nonlinear tip-sample interaction force. The higher harmonics contain important …

In multifrequency atomic force microscopy (AFM), probe's characteristic of assigning
resonance frequencies to integer harmonics results in a remarkable improvement of …

In atomic force microscopy, a force-sensing cantilever probes a sample and thereby creates
a topographic image of its surface. The simplest implementation uses the static deflection of …

Recently a new microcantilever design was introduced to achieve higher-harmonic
nonlinear atomic force microscopy (AFM) by utilizing the benefits of intentional nonlinearity …

The natural frequencies of a cantilever probe can be tuned with an attached concentrated
mass to coincide with the higher harmonics generated in a tapping-mode atomic force …

In atomic force microscopy, a force-sensing cantilever probes a sample and thereby creates
a topographic image of its surface. The simplest implementation uses the static deflection of …

The periodic impact force induced by tip-sample contact in a tapping mode atomic force
microscope (AFM) gives rise to the non-harmonic response of a micro-cantilever. These non …

Higher harmonics in tapping-mode atomic force microscopy offers the potential for imaging
and sensing material properties at the nanoscale. The signal level at a given harmonic of the …