A novel atomic force microscope (AFM) has been developed. Unlike conventional AFM
systems, its cantilever and tip were set up in the X direction with respect to the sample. It can …

We developed a multi-probe atomic force microscope (AFM) having two AFM cantilevers
independently controlled using the optical beam deflection method. We succeeded in …

The atomic force microscope AFM is a powerful instrument in nanometer-scale science and
technology. Since its invention in 1986, 1 AFM has evolved significantly, refining its …

Abstract Development of micro machined cantilever and optical lever detection system has
greatly facilitated the operation of atomic force microscopy. However, since the detection …

The atomic force microscope (AFM) has become an essential tool in a wide range of fields,
from materials science and semiconductor research to molecular biology. Various research …

A high-speed atomic force microscope (HS-AFM) based on a tip-sample combined scanning
architecture is presented. In this system, the X-scanner, which is separated from the AFM …

An atomic force microscope (AFM) with the function of measuring both bend θ x and twist θ y
of a rectangular‐shaped cantilever, with its longitudinal axis pointing in the y direction, was …

We have developed a new versatile scanning electron microscope (SEM)-atomic force
microscope (AFM) system capable of simultaneous SEM and AFM operation. The system …

In order to enhance the lateral force sensitivity of atomic force microscopy (AFM) to detect
atomic or molecular scale interaction, two types of force sensors were fabricated by …

We constructed an optical pickup head atomic force microscope (OPH-AFM). The
component used to monitor the displacement of the cantilever is made from the optical …