Atomic Force Microscopy (AFM) is widely used in physics, chemistry, and biology to analyze
the topography of a sample at nanometer resolution. Controlling precisely the force applied …

We show the interest of the high flexure modes of vibration for amplitude-controlled atomic
force microscopy (AFM). In connection with AFM working conditions, we define the …

In atomic force microscopy, a force-sensing cantilever probes a sample and thereby creates
a topographic image of its surface. The simplest implementation uses the static deflection of …

One of the most challenging aspects of operating an atomic force microscope (AFM) is
finding optimal feedback parameters. This statement applies particularly to frequency …

A control method, in which the tip-sample interaction force of each tapping cycle is directly
regulated, is proposed for dynamic mode atomic force microscopy. It does not rely on the …

High-speed imaging by atomic force microscopy (AFM) requires the implementation of a fast
control of tip–surface distance to maintain a constant interaction force. In particular, a well …

In dynamic atomic force microscopy (AFM) the cantilever is vibrated and its dynamics are
monitored to probe the sample with nanoscale and atomic resolution. Amplitude and …

Frequency modulation atomic force microscopy (FM-AFM) is rapidly evolving as the
technique of choice in the pursuit of high resolution imaging of biological samples in …

Quantifying the tip–sample interaction forces in amplitude-modulated atomic force
microscopy (AM-AFM) has been an elusive yet important goal in nanoscale imaging …

Agraduate student was recently heard lamenting,“I feel like my life is passing me by!” as he
waited for an atomic force microscope (AFM) image to form line-by-painstaking-line. In AFM …