Higher harmonics have been widely used to characterize nanomechanical properties of the
sample surface in tapping mode atomic force microscopy. They are usually analyzed by the …

Higher-harmonics generation in a tapping-mode atomic force microscope is a consequence
of the nonlinear tip-sample interaction force. The higher harmonics contain important …

In atomic force microscopy (AFM), high-frequency components consisted in dynamic tip-
sample interaction have been recently demonstrated as a promising technique for exploring …

The contribution of higher harmonics to the movement of a micro rectangular cantilever in
tapping mode AFM is investigated. The dependence between the phase lag of the higher …

The periodic impact force induced by tip-sample contact in a tapping mode atomic force
microscope (AFM) gives rise to the non-harmonic response of a micro-cantilever. These non …

In atomic force microscopy (AFM), the higher modes are highly sensitive to the tip-sample
interactions which generate many harmonics. When a higher harmonic is close to the …

Atomic force microscope (AFM) is an idealized tool to measure the physical and chemical
properties of the sample surfaces by reconstructing the force curve, which is of great …

In tapping-mode atomic force microscopy, nonlinear tip–sample interactions give rise to
higher harmonics of the cantilever vibration. We present an electrical circuit to model the …

In tapping-mode atomic-force microscopy usually amplitude and phase of the cantilever
motion are acquired. These signals are related to the fundamental oscillation frequency …

In atomic force microscopy, a force-sensing cantilever probes a sample and thereby creates
a topographic image of its surface. The simplest implementation uses the static deflection of …