While often overlooked, one of the prerequisites for high-speed amplitude modulation
atomic force microscopy is a high-bandwidth amplitude estimation technique. Conventional …

A fundamental challenge in dynamic mode atomic force microscopy (AFM) is the estimation
of the cantilever oscillation amplitude from the deflection signal, which might be distorted by …

In this review paper, traditional and novel demodulation methods applicable to amplitude-
modulation atomic force microscopy are implemented on a widely used digital processing …

In this paper, a method for imaging in amplitude-modulation atomic force microscopy is
developed which enables accurate sample-profile imaging even at high scanning speeds …

Frequency-modulation atomic force microscopy (FM-AFM) relies on an accurate tracking of
the resonance frequency of a scanning probe. It is now used in environments ranging from …

One of the most challenging aspects of operating an atomic force microscope (AFM) is
finding optimal feedback parameters. This statement applies particularly to frequency …

Dynamic mode operation of Atomic Force Microscopes relies on demodulation schemes to
get information from different flexure modes of the cantilever while imaging a sample. In the …

Nonlinear contact between tip and sample in tapping mode atomic force microscopy (AFM)
systems induces higher harmonics, which may be useful for extraction of some …

In any atomic force microscope operated in amplitude modulation mode, aka “tapping mode”
or “oscillating mode,” the most crucial operation is the detection of the cantilever oscillation …

Atomic Force Microscopy (AFM) is widely used in physics, chemistry, and biology to analyze
the topography of a sample at nanometer resolution. Controlling precisely the force applied …