The invention of the nanotechnology adds a new branch to investigate and control the
physical properties of matters at atomic level. The aim of this technology is to image the …

In recent years, the atomic force microscope (AFM) has become an important tool in
nanotechnology research. It was first conceived to generate 3-D images of conducting as …

High speed atomic force microscopy can provide the possibility of many new scientific
observations and applications ranging from nano-manufacturing to the study of biological …

Imaging speed is one of the key factors limiting atomic force microscope's (AFM) wide
applications. To improve its performance, a variable-speed scanning (VSS) method is …

This paper describes an alternative method to the widely-used raster-scan technique for
Atomic Force Microscopy (AFM). In this method, the sample is scanned in a spiral pattern …

A non-raster scanning technique for atomic force microscopy (AFM) imaging which
combines rotational and translational motion is presented. The use of rotational motion for …

Non-raster scanning is being widely used to increase the scanning speed of atomic force
microscopes (AFMs). However, like any other AFM scanning techniques, non-raster …

Atomic force microscopy (AFM) is a highly useful instrument for material inspection, capable
of scanning conductive and nonconductive samples without any restrictions as to the …

A spiral scanning method is proposed for atomic force microscopy with thoroughgoing
analysis and implementation. Comparing with the traditional line-by-line scanning method …

A key hurdle in achieving high scan speeds in atomic force microscopes is that the probe is
required to be scanned over the sample in a zig-zag raster pattern. The fast axis of the AFM …