We propose a force-spectroscopy technique where a higher order mode of a cantilever is
excited simultaneously with the first. Resonance tracking of both vibration modes through a …

Increasing the signal-to-noise ratio in dynamic atomic force microscopy plays a key role in
nanomechanical mapping of materials with atomic resolution. In this work, we develop an …

We develop a theoretical formalism to describe bimodal atomic force microscopy (AFM)
experiments. The theory relates observables such as amplitudes and phase shifts to …

Many advanced dynamic Atomic Force Microscopy (AFM) techniques such as contact
resonance, force modulation, piezoresponse force microscopy, electrochemical strain …

Scanning probe microscopy has emerged as a primary tool for exploring and controlling the
nanoworld. A critical part of scanning probe measurements is the information transfer from …

We develop a theory that explains the origin of the high force sensitivity observed in
multifrequency force microscopy experiments. The ability of the microscope to extract …

In atomic force microscopy a cantilever with a sharp tip attached to it is scanned over the
surface of a sample, and information about the surface is extracted by measuring how the …

We have recently proposed a new dual-frequency-modulation atomic force microscopy
scheme using two cantilevers in series to measure the tip–sample interaction force curves …

We provide a method to characterize the tip radius of an atomic force microscopy in situ by
monitoring the dynamics of the cantilever in ambient conditions. The key concept is that the …

A mode of atomic force microscopy (AFM) is demonstrated where an oscillating AFM
cantilever having linear response is driven with two frequencies in the vicinity of a …