A method is presented to enhance the optical lever sensitivity in dynamic atomic force
microscopy (AFM) by nearly an order of magnitude over a wide frequency bandwidth. This is …

The advancement of dynamic and multifrequency atomic force microscopy (AFM)
necessitates leveraging the frequency response of cantilevers when it is in contact with the …

While conventional techniques in dynamic mode atomic force microscopy typically involve
the excitation of the first flexural mode of a microcantilever, situations arise where the …

In atomic force microscopy, a force-sensing cantilever probes a sample and thereby creates
a topographic image of its surface. The simplest implementation uses the static deflection of …

Atomic force microscope (AFM) cantilevers with integrated actuation and sensing provide
several distinct advantages over conventional cantilever instrumentation. These include …

In this article, we propose a method, using weakly coupled cantilevers, to enhance the
sensitivity of atomic force microscopy (AFM) by several orders of magnitudes. There are two …

Abstract The Atomic Force Microscope (AFM) is a tool for imaging surfaces at the micro and
nano meter scale. The microscope senses the force acting between a surface and a tip …

Small cantilevers with ultra-high resonant frequencies (1–3 MHz) have paved the way for
high-speed atomic force microscopy. However, their potential for multi-frequency atomic …

With increasing efforts to improve resolution and material contrast in dynamic atomic force
microscopy (dAFM), it has become important to precisely understand and exploit the …

Microcantilevers are at the heart of atomic force microscopy (AFM) and play a significant role
in AFM‐based techniques. Recent advancements in multifrequency AFM require the …