Lateral force calibration in atomic force microscopy: A new lateral force calibration method and general guidelines for optimization

RJ Cannara, M Eglin, RW Carpick - Review of Scientific Instruments, 2006 - pubs.aip.org
Proper force calibration is a critical step in atomic and lateral force microscopies (AFM/LFM).
The recently published torsional Sader method [CP Green et al, Rev. Sci. Instrum. 75, 1988 …

An improved wedge calibration method for lateral force in atomic force microscopy

M Varenberg, I Etsion, G Halperin - Review of scientific instruments, 2003 - pubs.aip.org
An improved wedge calibration method for quantitative lateral force measurement in atomic
force microscopy is presented. The improved method differs from the original one in several …

[HTML][HTML] A non-contact, thermal noise based method for the calibration of lateral deflection sensitivity in atomic force microscopy

N Mullin, JK Hobbs - Review of Scientific Instruments, 2014 - pubs.aip.org
Calibration of lateral forces and displacements has been a long standing problem in lateral
force microscopies. Recently, it was shown by Wagner et al. that the thermal noise spectrum …

Direct force balance method for atomic force microscopy lateral force calibration

DB Asay, SH Kim - Review of Scientific Instruments, 2006 - pubs.aip.org
A new and simple calibration method for atomic force microscopy (AFM) is developed. This
nonscanning method is based on direct force balances on surfaces with known slopes. The …

Easy and direct method for calibrating atomic force microscopy lateral force measurements

W Liu, K Bonin, M Guthold - Review of scientific instruments, 2007 - pubs.aip.org
We have designed and tested a new, inexpensive, easy-to-make and easy-to-use
calibration standard for atomic force microscopy (AFM) lateral force measurements. This …

Calibration of optical lever sensitivity for atomic force microscopy

NP D'Costa, JH Hoh - Review of Scientific Instruments, 1995 - pubs.aip.org
Accurate force determinations in atomic force microscopy require the precise measurement
of cantilever deflections. A limiting factor in making these measurements is the calibration of …

Influence of atomic force microscope cantilever tilt and induced torque on force measurements

SA Edwards, WA Ducker, JE Sader - Journal of Applied Physics, 2008 - pubs.aip.org
Quantitative force measurements performed using the atomic force microscope (AFM)
inherently rely on calibration of the AFM cantilever spring constant to convert the measured …

Force calibration in lateral force microscopy: a review of the experimental methods

M Munz - Journal of Physics D: Applied Physics, 2010 - iopscience.iop.org
Lateral force microscopy (LFM) is a variation of atomic/scanning force microscopy
(AFM/SFM). It relies on the torsional deformation of the AFM cantilever that results from the …

Normal and lateral force calibration techniques for AFM cantilevers

MLB Palacio, B Bhushan - Critical Reviews in Solid State and …, 2010 - Taylor & Francis
Atomic force microscopy (AFM) is a useful tool, not only for imaging but also for
quantification of normal and lateral forces exerted on the AFM tip while interacting with the …

Cantilever tilt compensation for variable-load atomic force microscopy

RJ Cannara, MJ Brukman, RW Carpick - Review of scientific …, 2005 - pubs.aip.org
In atomic force microscopy (AFM), typically the cantilever's long axis forms an angle with
respect to the plane of the sample's surface. This has consequences for contact mode …