Using a simple model, we investigated the difference between the forces measured by an
atomic force microscope (AFM) with an optical lever deflection method and that with an …

In this letter, a method to calibrate sensitivity for the three‐dimensional displacement of X, Y,
and Z directions by using the novel force curve, namely lateral force curve, as well as vertical …

The atomic force microscopy (AFM) is a very important tool for imaging and investigating the
complex force interactions on sample surfaces with high spatial resolution. In the AFM, two …

Most atomic force microscopes employ the optical lever deflection method using a quadrant
photodetector as the displacement sensor of the cantilever, which enables it to detect lateral …

Using a simple model, we investigated the contributions of both the frictional force and the
normal reacting force to the topography and the lateral force observed with an atomic …

A novel method that uses a small mechanical lever has been developed to directly calibrate
the lateral sensitivity of the optical lever in the atomic force microscope (AFM). The …

In an atomic force microscope (AFM), the force is normally sensed by measuring the
deflection of a cantilever by an optical lever technique. Experimental results show a …

A compact and two-dimensional atomic force microscope (AFM) using an orthogonal sample
scanner, a calibrated homodyne laser interferometer and a commercial AFM head was …

Abstract Development of micro machined cantilever and optical lever detection system has
greatly facilitated the operation of atomic force microscopy. However, since the detection …

A novel calibration method is proposed for determining lateral forces in atomic force
microscopy (AFM), by introducing an angle conversion factor, which is defined as the ratio of …