The effect of BCl3 pretreatment on the etching of AlN in Cl2-based plasma

X Xu, V Kuryatkov, B Borisov, M Pandikunta… - MRS Online …, 2008 - cambridge.org
The effect of BCl3 and BCl3/Ar pretreatment on Cl2/Ar and Cl2/Ar/BCl3 dry etching of AlN is
investigated using inductively coupled plasma reactive ion etching. The native AlN oxide …

High rate etching of AlN using BCl3/Cl2/Ar inductively coupled plasma

FA Khan, L Zhou, V Kumar, I Adesida… - Materials Science and …, 2002 - Elsevier
Inductively-coupled-plasma reactive ion etching of AlN was investigated using BCl3/Cl2/Ar
gas chemistry. AlN etch rates were studied as a function of substrate bias voltage (− 150 to …

Etch Mechanism of AlN Thin Film in Cl2/Ar Inductively Coupled Plasma

JC Woo, DP Kim, GH Kim - Transactions on Electrical and Electronic …, 2022 - Springer
The etching characteristics of aluminum nitride (AlN) were investigated with the etch rate of
AlN thin film and the selectivity of AlN to SiO2 in an inductively coupled Cl2/Ar plasma. The …

Highly selective dry etching of III nitrides using an inductively coupled plasma

JM Lee, KM Chang, IH Lee, SJ Park - Journal of Vacuum Science & …, 2000 - pubs.aip.org
The selective etch characteristics of GaN, Al x Ga 1− x N, and In x Ga 1− x N have been
examined in an inductively coupled plasma reactor using Cl 2/Ar/O 2 as the etchant gas …

Inductively coupled plasma–reactive ion etching of c-and a-plane AlGaN over the entire Al composition range: Effect of BCl3 pretreatment in Cl2/Ar plasma chemistry

AP Shah, MR Laskar, A Azizur Rahman… - Journal of Vacuum …, 2013 - pubs.aip.org
Inductively coupled plasma (ICP)–reactive ion etching (RIE) patterning is a standard
processing step for UV and optical photonic devices based on III-nitride materials. There is …

Fabrication of an AlN ridge structure using inductively coupled Cl2/BCl3 plasma and a TMAH solution

H Okumura - Japanese Journal of Applied Physics, 2019 - iopscience.iop.org
We fabricated an AlN ridge structure using a chlorine-based inductive-coupled plasma
reactive-ion etching (ICP-RIE) and a tetramethylammonium hydroxide (TMAH) solution. The …

ICP-RIE etching of polar, semi-polar and non-polar AlN: comparison of Cl2/Ar and Cl2/BCl3/Ar plasma chemistry and surface pretreatment

AP Shah, AA Rahman… - … Science and Technology, 2014 - iopscience.iop.org
We report a comprehensive investigation of inductively-coupled plasma reactive ion etching
(ICP-RIE) of polar (0001) c-plane, semi-polar (11–22) and non-polar (11–20) a-plane AlN …

Reactive ion etching of aluminum using SiCl4

M Sato, H Nakamura - Journal of Vacuum Science and Technology, 1982 - pubs.aip.org
Reactive ion etching of aluminum using SiCl4 is described and compared with that using
CCl4. In SiCl4 plasmas, a high aluminum etch rate is maintained which is slightly dependent …

AlN Etching under ICP Cl2/BCl3/Ar Plasma Mixture: Experimental Characterization and Plasma Kinetic Model

M Rammal, A Rhallabi, D Néel, D Make, A Shen… - MRS …, 2019 - cambridge.org
AlN etching with chloride plasmas is studied. The experimental results show that the etching
of AlN under a low pressure Cl2/Ar plasma mixture in moderate DC bias is not possible. The …

Reactive ion etching of GaN using BCl3, BCl3/Ar and BCl3/N2 gas plasmas

D Basak, T Nakanishi, S Sakai - Solid-State Electronics, 2000 - Elsevier
Reactive ion etching (RIE) of GaN has been performed using BCl3 and additives, Ar and N2,
to BCl3 plasma. The etch rate, surface roughness and the etch profile have been …