The detection of higher modes of oscillation in atomic force microscopy can provide
additional information on sample properties. However, the limited bandwidth of the …

In this work, we study the performance of a new cantilever design during multi-frequency
tapping mode Atomic Force Microscopy (AFM). The system consists of a base cantilever with …

The experimental characterisation of a set of microcantilevers targeted at use in multi‐
frequency atomic force microscope is presented. The aim of this work is to design a …

Increasing the signal-to-noise ratio in dynamic atomic force microscopy plays a key role in
nanomechanical mapping of materials with atomic resolution. In this work, we develop an …

The optical lever detection scheme is widely used in atomic force microscopy for the
detection of the cantilever deflection. Laser spot size as well as adjustment of the laser along …

We analyze the steady state tip sample interaction in atomic force microscopy by using an
electrical circuit simulator. The phase shift between the cantilever excitation and tip, and the …

In frequency modulation atomic force microscopy, the stiffness, quality factor and oscillation
amplitude of the cantilever are important parameters. While the first atomic resolution results …

Due to the harmonic motion of the cantilever in Tapping Mode Atomic Force Microscopy, it is
seemingly impossible to estimate the tip-sample interactions from the motion of the …

In tapping-mode atomic force microscopy, nonlinear tip–sample interactions give rise to
higher harmonics of the cantilever vibration. We present an electrical circuit to model the …

In the operation of a dynamic mode atomic force microscope, a micro-fabricated rectangular
cantilever is typically oscillated at or near its mechanical resonance frequency. Lateral …