Higher harmonics in tapping-mode atomic force microscopy offers the potential for imaging
and sensing material properties at the nanoscale. The signal level at a given harmonic of the …

The natural frequencies of a cantilever probe can be tuned with an attached concentrated
mass to coincide with the higher harmonics generated in a tapping-mode atomic force …

We present an experimental analysis of the nonlinear tip–sample interaction in tapping-
mode atomic-force microscopy by exploiting anharmonic contributions of the cantilever …

In tapping-mode atomic-force microscopy usually amplitude and phase of the cantilever
motion are acquired. These signals are related to the fundamental oscillation frequency …

In tapping-mode atomic force microscopy, nonlinear tip–sample interactions give rise to
higher harmonics of the cantilever vibration. We present an electrical circuit to model the …

In a tapping-mode atomic force microscope, the frequency spectrum of the oscillating
cantilever contains higher harmonics at integer multiples of the excitation frequency. When …

In this work, we study the performance of a new cantilever design during multi-frequency
tapping mode Atomic Force Microscopy (AFM). The system consists of a base cantilever with …

Higher-harmonics generation in a tapping-mode atomic force microscope is a consequence
of the nonlinear tip-sample interaction force. The higher harmonics contain important …

By spectroscopic analysis of the cantilever oscillation in tapping-mode atomic-force
microscopy (TM–AFM), we demonstrate that the transition from an oscillatory state …

We present a micromachined scanning probe cantilever, in which a specific higher-order
flexural mode is designed to be resonant at an exact integer multiple of the fundamental …