Increasing the signal-to-noise ratio in dynamic atomic force microscopy plays a key role in
nanomechanical mapping of materials with atomic resolution. In this work, we develop an …

Dynamic atomic force microscopy, in essence, consists of a vibrating microcantilever with a
nanoscale tip that interacts with a sample surface via short-and long-range intermolecular …

The natural frequencies of a cantilever probe can be tuned with an attached concentrated
mass to coincide with the higher harmonics generated in a tapping-mode atomic force …

Higher harmonics in tapping-mode atomic force microscopy offers the potential for imaging
and sensing material properties at the nanoscale. The signal level at a given harmonic of the …

We propose a force-spectroscopy technique where a higher order mode of a cantilever is
excited simultaneously with the first. Resonance tracking of both vibration modes through a …

The detection of higher modes of oscillation in atomic force microscopy can provide
additional information on sample properties. However, the limited bandwidth of the …

Dynamic mode operation of Atomic Force Microscopes relies on demodulation schemes to
get information from different flexure modes of the cantilever while imaging a sample. In the …

High speed imaging and mapping of nanomechanical properties in atomic force microscopy
(AFM) allows the observation and characterization of dynamic sample processes. Recent …

We present an experimental analysis of the nonlinear tip–sample interaction in tapping-
mode atomic-force microscopy by exploiting anharmonic contributions of the cantilever …

During dynamic atomic force microscopy (AFM), the deflection of a scanning cantilever
generates multiple frequency terms due to the nonlinear nature of AFM tip–sample …