B Ohler - Review of Scientific Instruments, 2007 - pubs.aip.org
Uncertainty in cantilever spring constants is a critical issue in atomic force microscopy (AFM) force measurements. Though numerous methods exist for calibrating cantilever spring …
H Xie, J Vitard, S Haliyo, S Régnier - Review of Scientific Instruments, 2008 - pubs.aip.org
A novel method that uses a small mechanical lever has been developed to directly calibrate the lateral sensitivity of the optical lever in the atomic force microscope (AFM). The …
Atomic force microscopes typically require knowledge of the cantilever spring constant and optical lever sensitivity in order to accurately determine the force from the cantilever …
JE Sader, JR Friend - Review of Scientific Instruments, 2014 - pubs.aip.org
A simplified method for calibrating atomic force microscope cantilevers was recently proposed by Sader et al [Rev. Sci. Instrum. 83, 103705 (2012); Sec. III D] that relies solely on …
In an atomic force microscope (AFM), the force is normally sensed by measuring the deflection of a cantilever by an optical lever technique. Experimental results show a …
D Kiracofe, A Raman - Journal of Applied Physics, 2010 - pubs.aip.org
The effect of hydrodynamic loading on the eigenmode shapes, modal stiffnesses, and optical lever sensitivities of atomic force microscope (AFM) microcantilevers is investigated …
GA Matei, EJ Thoreson, JR Pratt, DB Newell… - Review of Scientific …, 2006 - pubs.aip.org
Although atomic force microscopes AFMs have been commercially available for over a decade, calibration of the stiffness spring constant of the force sensing cantilever has …
Standard spring constant calibration methods are compared when applied to higher eigenmodes of cantilevers used in dynamic atomic force microscopy (dAFM). Analysis …
The atomic force microscope (AFM) is a powerful tool for the measurement of forces at the micro/nano scale when calibrated cantilevers are used. Besides many existing calibration …