Theory of amplitude modulation atomic force microscopy with and without Q-control

H Hölscher, UD Schwarz - International Journal of Non-linear mechanics, 2007 - Elsevier
The present text reviews the fundamentals of amplitude-modulation atomic force microscopy
(AM-AFM), which is frequently also referred to as dynamic force microscopy, non-contact …

Cantilever dynamics in amplitude modulation AFM: continuous and discontinuous transitions

S Santos, V Barcons, J Font… - Journal of Physics D …, 2010 - iopscience.iop.org
Transitions between the attractive and the repulsive force regimes for amplitude modulation
atomic force microscopy (AFM) can be either discontinuous, with a corresponding jump in …

[图书][B] Amplitude modulation atomic force microscopy

R García - 2011 - books.google.com
Filling a gap in the literature, this book features in-depth discussions on amplitude
modulation AFM, providing an overview of the theory, instrumental considerations and …

Fourier transformed atomic force microscopy: tapping mode atomic force microscopy beyond the Hookian approximation

RW Stark, WM Heckl - Surface Science, 2000 - Elsevier
The periodic impact force induced by the tip–sample contact in tapping mode atomic force
microscopy (TM-AFM) gives rise to anharmonic oscillations of the sensing cantilever. These …

Quantitative atomic force microscopy

H Söngen, R Bechstein, A Kühnle - Journal of Physics …, 2017 - iopscience.iop.org
A variety of atomic force microscopy (AFM) modes is employed in the field of surface
science. The most prominent AFM modes include the amplitude modulation (AM) and the …

Theory of Q control in atomic force microscopy

TR Rodrıguez, R Garcı́a - Applied Physics Letters, 2003 - pubs.aip.org
We discuss the performance of an atomic force microscope AFM operated in the amplitude
modulation mode under a self-excitation signal, known as quality factor control (Q control. By …

Spectroscopy of higher harmonics in dynamic atomic force microscopy

RW Stark - Nanotechnology, 2003 - iopscience.iop.org
Dynamic atomic force microscopy (AFM) is a standard technique for imaging and the
analysis of surfaces at the nanometre scale. In order to estimate material properties from the …

Coupling of conservative and dissipative forces in frequency-modulation atomic force microscopy

JE Sader, SP Jarvis - Physical Review B—Condensed Matter and Materials …, 2006 - APS
Frequency modulation atomic force microscopy (FM-AFM) utilizes the principle of self-
excitation to ensure the cantilever probe vibrates at its resonant frequency, regardless of the …

Dynamic modes of atomic force microscopy

A Schirmeisen, B Anczykowski, H Hölscher… - … and Nanomechanics I …, 2011 - Springer
This atomic force microscope (AFM) dynamic atomic force microscope (dynamic AFM)
chapter presents an introduction to the concept of the dynamic operational modes of the …

Spectroscopy of the anharmonic cantilever oscillations in tapping-mode atomic-force microscopy

M Stark, RW Stark, WM Heckl… - Applied Physics …, 2000 - pubs.aip.org
By spectroscopic analysis of the cantilever oscillation in tapping-mode atomic-force
microscopy (TM–AFM), we demonstrate that the transition from an oscillatory state …