We present here a method to calibrate the lateral force in the atomic force microscope. This
method makes use of an accurately calibrated force sensor composed of a tipless …

We describe a method to calibrate the spring constants of cantilevers for atomic force
microscopy (AFM). The method makes use of a “piezosensor” composed of a piezoresistive …

Accurate force determinations in atomic force microscopy require the precise measurement
of cantilever deflections. A limiting factor in making these measurements is the calibration of …

Force studies using atomic force microscopy generally require knowledge of the cantilever
spring constants and the optical lever sensitivity. The traditional method of evaluating the …

The atomic force microscope (AFM) is a tool that enables the measurement of precisely
localized forces with unprecedented resolution in time, space and force. At the heart of this …

Proper force calibration is a critical step in atomic and lateral force microscopies (AFM/LFM).
The recently published torsional Sader method [CP Green et al, Rev. Sci. Instrum. 75, 1988 …

We have designed and tested a new, inexpensive, easy-to-make and easy-to-use
calibration standard for atomic force microscopy (AFM) lateral force measurements. This …

The atomic force microscope (AFM) can provide qualitative information by numerous
imaging modes, but it can also provide quantitative information when calibrated cantilevers …

Atomic force microscopes typically require knowledge of the cantilever spring constant and
optical lever sensitivity in order to accurately determine the force from the cantilever …

A new and simple calibration method for atomic force microscopy (AFM) is developed. This
nonscanning method is based on direct force balances on surfaces with known slopes. The …