We describe a method to calibrate the spring constants of cantilevers for atomic force
microscopy (AFM). The method makes use of a “piezosensor” composed of a piezoresistive …

The measurement of small forces by atomic force microscopy (AFM) is of increasing
importance in many applications. For example, in analytical applications where individual …

We present here a method to calibrate the lateral force in the atomic force microscope. This
method makes use of an accurately calibrated force sensor composed of a tipless …

There are many atomic force microscopy (AFM) applications that rely on quantifying the
force between the AFM cantilever tip and the sample. The AFM does not explicitly measure …

A method for calibrating the stiffness of atomic force microscope (AFM) cantilevers is
demonstrated using an array of uniform microfabricated reference cantilevers. A series of …

The atomic force microscope (AFM) can provide qualitative information by numerous
imaging modes, but it can also provide quantitative information when calibrated cantilevers …

Considerable attention has been given to the calibration of AFM cantilever spring constants
in the last 20 years. Techniques that do not require tip-sample contact are considered …

Although atomic force microscopes AFMs have been commercially available for over a
decade, calibration of the stiffness spring constant of the force sensing cantilever has …

Static methods to determine the spring constant of AFM cantilevers have been widely used
in the scientific community since the importance of such calibration techniques was …

Many common atomic force microscope (AFM) spring constant calibration methods regard
the AFM probe as a uniform cantilever, neglecting the tip mass and any nonuniformity in the …