We report on the layer thickness determination on dielectrically coated metal cylinders using
terahertz (THz) time-domain spectroscopy. A considerable sensitivity increase of up to a …

We report on layer thickness determination down to a thickness of 2.5 microns using
terahertz waveguide spectroscopy. Compared to typical single-pass transmission …

We present a multilayer thickness measurement system based on optoelectronic continuous
wave THz spectroscopy. Due to its wide tuning range, high frequency resolution, and fast …

There is a minimum measurable thickness when gauging micron-level coating films with
time-of-flight based terahertz thickness measurement technologies. To improve this …

We demonstrate time‐resolved terahertz spectroscopy inside a novel parallel plate
waveguide where one of the metallic plates is replaced by a transparent conducting oxide …

We present a novel approach to determine the individual layer thickness in a dielectric
multilayer sample using pulsed terahertz spectroscopy in reflection geometry. In a first step …

In recent years with the advent of powerful fs lasers and new optoelectronic techniques,
great progress has been made in the field of THz 1012 Hz radiation and THz spectroscopy …

The quality of coatings in industrial applications and scientific research with thicknesses in
the micrometer range is an important criterion for quality management. Therefore, thickness …

Abstract Development of techniques for characterization of extremely thin films is an
important challenge in terahertz (THz) science and applications. Spectroscopic …

We present a low cost terahertz (THz) spectrometer with coherent detection based on two
simple and robust dipole antennas driven by two laser diodes. The spectrometer covers …