A review on numerical methods for thickness determination in terahertz time-domain spectroscopy

S Mukherjee, NMA Kumar, PC Upadhya… - The European Physical …, 2021 - Springer
The use of numerical methods for thickness extraction in terahertz time-domain
spectroscopy (THz-TDS) is highly deterministic in improving the accuracy of optical …

Sample thickness measurement with THz-TDS: Resolution and implications

CY Jen, C Richter - Journal of Infrared, Millimeter, and Terahertz Waves, 2014 - Springer
The accuracy of any measurement with terahertz time-domain spectroscopy (THz-TDS)
depends strongly on knowing and supplying the precise sample thickness when processing …

A sensitive and versatile thickness determination method based on non-inflection terahertz property fitting

X Chen, E Pickwell-MacPherson - Sensors, 2019 - mdpi.com
The accuracy of thin-film characterization in terahertz spectroscopy is mainly set by the
thickness uncertainty. Physical thickness measurement has limited accuracy for thin-film …

Material thickness optimization for transmission-mode terahertz time-domain spectroscopy

W Withayachumnankul, BM Fischer, D Abbott - Optics express, 2008 - opg.optica.org
The thickness of a sample material for a transmission-mode terahertz time-domain
spectroscopy (THz-TDS) measurement is the subject of interest in this paper. A sample that …

Decoupling substrate thickness and refractive index measurement in THz time-domain spectroscopy

F Vandrevala, E Einarsson - Optics express, 2018 - opg.optica.org
Terahertz time-domain spectroscopy (THz–TDS) relies heavily on knowing precisely the
thickness or refractive index of a material. In practice, one of these values is assumed to be …

Accurate Thickness Measurement Based on Dispersion Compensation via Terahertz Time-Domain Spectroscopy

D Liu, F Qi - IEEE Transactions on Microwave Theory and …, 2023 - ieeexplore.ieee.org
Terahertz time-domain spectroscopy (THz-TDS) has shown significant potential in thickness
detection. The time-of-flight (TOF) method is most widely used for judgment. However, the …

Silicon wafer thickness measurement using terahertz time domain spectroscopy main

CY Jen, C Richter - Ultrafast Phenomena and Nanophotonics …, 2014 - spiedigitallibrary.org
When measuring optical material parameters with terahertz spectroscopy the accuracy of the
material parameters measured depends strongly on knowing and supplying the precise …

Limitation in thin-film sensing with transmission-mode terahertz time-domain spectroscopy

W Withayachumnankul, JF O'Hara, W Cao, I Al-Naib… - Optics …, 2014 - opg.optica.org
Thin-film sensing with a film thickness much less than a wavelength is an important
challenge in conventional transmission-mode terahertz time-domain spectroscopy (THz …

Terahertz multilayer thickness measurements: comparison of optoelectronic time and frequency domain systems

L Liebermeister, S Nellen, RB Kohlhaas… - Journal of Infrared …, 2021 - Springer
A bstract We compare a state-of-the-art terahertz (THz) time domain spectroscopy (TDS)
system and a novel optoelectronic frequency domain spectroscopy (FDS) system with …

Thickness Determination for Homogeneous Dielectric Materials through THz-TDS

W Withayachumnankul, BM Fischer… - 2006 Joint 31st …, 2006 - ieeexplore.ieee.org
Through the use of terahertz time-domain spectroscopy (THz-TDS), the sample thickness
can be determined by exploiting the Fabry-Perot effect. Given the reference pulse and the …