Impact of dielectric and copper via design on wafer-to-wafer hybrid bonding

V Dubey, D Wünsch, K Gottfried… - 2023 IEEE 73rd …, 2023 - ieeexplore.ieee.org
Hybrid bonding is key to achieving high-quality interconnect interfaces for fine pitch
integration. It has an advantage over other types of interconnects as it allows a high I/O …

Process and Design Challenges for Hybrid Bonding

V Dubey, D Wünsch, K Gottfried, M Wiemer… - Ecs …, 2023 - iopscience.iop.org
Achieving high-quality interconnect interfaces for fine pitch integration is crucial in today's
advanced electronic systems. Among various interconnect options, hybrid bonding stands …

Scaling Cu/SiCN Wafer-to-Wafer Hybrid Bonding down to 400 nm interconnect pitch

B Zhang, SA Chew, M Stucchi… - 2024 IEEE 74th …, 2024 - ieeexplore.ieee.org
This study presents groundbreaking outcomes of 400nm pitch wafer-to-wafer (W2W) hybrid
bonding connections with a Cu/SiCN bonding interface. A new test vehicle is introduced and …

Aggressive pitch scaling (sub-0.5 μm) of W2W hybrid bonding through process innovations

T Sherwood, R Patlolla, J Salfelder… - 2023 IEEE 73rd …, 2023 - ieeexplore.ieee.org
3D integration of dissimilar wafers through metal interconnect hybrid bonding has become
common practice in industry from CMOS image sensors to 3D NAND memory at >1μm …

Recent developments in fine pitch wafer-to-wafer hybrid bonding with copper interconnect

JA Theil, L Mirkarimi, G Fountain… - 2019 International …, 2019 - ieeexplore.ieee.org
3D architectures are increasingly making their way into commercial products such as image
sensors and 3D memory. While hybrid bonding exists today in wafer-to-wafer (W2W) format …

A Microstructural Investigation of Sub-1 μm Copper Bonding Contact Structures in Die-to-Wafer Hybrid Bonding

S Al Zerey, J Cho, R Yu… - 2024 IEEE 74th Electronic …, 2024 - ieeexplore.ieee.org
This study explored the fine pitch scalability of the die-to-die level vertical stacking through
the Cu/SiO 2 hybrid bonding technique for chips with varying Cu contact diameters (0.8-4 …

0.5 μm pitch next generation hybrid bonding with high alignment accuracy for 3D integration

C Netzband, K Ryan, Y Mimura, S Ilseok… - 2023 IEEE 73rd …, 2023 - ieeexplore.ieee.org
Copper to copper hybrid bonding is a key area of development for many devices. A major
focus of hybrid bonding development is reducing the size of the bond pads. The current …

New Cu “Bulge-Out” Mechanism Supporting SubMicron Scaling of Hybrid Wafer-to-Wafer Bonding

J De Messemaeker, L Witters, B Zhang… - 2023 IEEE 73rd …, 2023 - ieeexplore.ieee.org
In order to scale wafer-to-wafer hybrid bonding to sub-micrometer pitches, a tight control of
surface topography after CMP is required. The post CMP Cu pad recess with respect to the …

Electrical analysis of wafer-to-wafer copper hybrid bonding at sub-micron pitches

K Ryan, C Netzband, A Gildea… - 2023 IEEE 73rd …, 2023 - ieeexplore.ieee.org
Multi-level back-end-of-line (BEOL) test vehicles have been produced to evaluate the
performance of the Tokyo Electron (TEL) wafer-to-wafer (W2W) bonding tool platform. The …

700nm pitch Cu/SiCN wafer-to-wafer hybrid bonding

SA Chew, S Iacovo, F Fordor, S Dewilde… - 2022 IEEE 24th …, 2022 - ieeexplore.ieee.org
Wafer-to-wafer (W2W) hybrid bonding has gained more attention as the Artificial intelligence
(AI) and big data machine learning (ML) applications required higher interconnect densities …