We developed a dual-probe atomic force microscopy (DP-AFM) system with two cantilever
probes that can be operated in various environments such as in air, vacuum, and liquid. The …

We developed a multi-probe atomic force microscope (MP-AFM) system with up to four
probes and realized various functions such as topography mapping, probing electrical …

We developed a dual-probe (DP) atomic force microscopy (AFM) system that has two
independently controlled probes. The deflection of each cantilever is measured by the …

We developed a multi-probe atomic force microscope (AFM) having two AFM cantilevers
independently controlled using the optical beam deflection method. We succeeded in …

The atomic force microscopy (AFM) is a very important tool for imaging and investigating the
complex force interactions on sample surfaces with high spatial resolution. In the AFM, two …

The atomic force microscope AFM is a powerful instrument in nanometer-scale science and
technology. Since its invention in 1986, 1 AFM has evolved significantly, refining its …

A novel atomic force microscope (AFM) has been developed. Unlike conventional AFM
systems, its cantilever and tip were set up in the X direction with respect to the sample. It can …

The stationary-sample (scanning-probe)-type atomic force microscope (AFM) has been
demonstrated to have many advantages over its conventional counterpart: the scanning …

We present a novel thin head atomic force microscope (AFM) that can be easily integrated
with an upright optical microscope (OM). The optical beam detection unit in the AFM used an …

Historically, precise vertical control of an atomic force microscope (AFM) tip while it is
disengaged from the surface has been an unsolved problem. By separately scattering a pair …