This paper discusses the scanning performance of a trimmed atomic force microscope
(AFM) tip. A standard tip was trimmed by focused ion beam (FIB) sputtering to achieve a …

A new tip characterizer based on the fabrication of multilayer thin films for atomic force
microscopy (AFM) was developed to analyze the effective tip shape while in use. The …

The ability to replace and reuse only the tip of the probe in an atomic force microscope
(AFM) enables employing a greater variety of probes, enhancing their functionalities, and …

Using a recently developed atomic force microscopy (AFM) simulator ACCESS (AFM
simulation Code for Calculating and Evaluating Surface Structures), effects of tip apex size …

An atomic force microscopy (AFM) tip characterizer with measurement ranges from 7.7 nm to
131 nm was developed using Si/SiO2 multilayers. This characterizer was constructed with …

This paper describes a contact atomic force microscope (AFM) that can be used for high-
speed precision measurements of microstructured surfaces. The AFM is composed of an air …

The influence of tip size on surface roughness measurements by atomic force microscopy
(AFM) was evaluated experimentally. Images of quartz over a lateral scan range of 125 …

Microtribology characteristics were determined by using a combination of single asperities
and three types of FIB (focused ion beam)-processed cantilevers for AFM (atomic force …

We investigated the use of a novel class of porous thin films for the characterization of
tapping mode atomic force microscope (AFM) tips. Chromium and titanium films were …

Different fabrication technologies for atomic force microscopy (AFM) probes have been
investigated, emphasizing the fabrication of versatile tip shapes, which can be integrated …