Epitaxial ScAlN etch-stop layers grown by molecular beam epitaxy for selective etching of AlN and GaN

MT Hardy, BP Downey, DJ Meyer… - IEEE Transactions …, 2017 - ieeexplore.ieee.org
Although selective dry etches exist for GaN, it is difficult to selectively etch AlN in
heterostructures with other conventional III-N epitaxial materials. The reduction in etch rate …

Dry etching of GaN and related materials: comparison of techniques

J Lee, H Cho, DC Hays, CR Abernathy… - IEEE Journal of …, 1998 - ieeexplore.ieee.org
The etch rates and feature anisotropy for GaN, AlN, and InN etched in Cl/sub 2/-Ar plasmas
with four different techniques were examined. Conventional reactive ion etching produces …

Inductively coupled BCl3/Cl2/Ar plasma etching of Al-rich AlGaN

EA Douglas, CA Sanchez, RJ Kaplar… - Journal of Vacuum …, 2017 - pubs.aip.org
Varying atomic ratios in compound semiconductors is well known to have large effects on
the etching properties of the material. The use of thin device barrier layers, down to 25 nm …

-Based Inductively Coupled Plasma Etching of GaN/AlGaN Using Photoresist Mask

DS Rawal, HK Malik, VR Agarwal… - … on plasma science, 2012 - ieeexplore.ieee.org
Gallium nitride/aluminium gallium nitride (GaN/AlGaN) etching in BCl 3/Cl 2-based
inductively coupled plasma (ICP) is investigated for high electron mobility transistor (HEMT) …

Highly selective dry etching of III nitrides using an inductively coupled plasma

JM Lee, KM Chang, IH Lee, SJ Park - Journal of Vacuum Science & …, 2000 - pubs.aip.org
The selective etch characteristics of GaN, Al x Ga 1− x N, and In x Ga 1− x N have been
examined in an inductively coupled plasma reactor using Cl 2/Ar/O 2 as the etchant gas …

Highly selective zero-bias plasma etching of GaN over AlGaN

ML Schuette, W Lu - Journal of Vacuum Science & Technology B …, 2007 - pubs.aip.org
Highly selective, low-damage etching of GaN over AlGaN is realized by zero-bias, nitrogen-
rich N 2∕ Cl 2∕ O 2 inductively coupled plasma, affording sub-10‐nm∕ min etch rates and …

Characterization of plasma-induced damage of selectively recessed GaN/InAlN/AlN/GaN heterostructures using SiCl4 and SF6

C Ostermaier, G Pozzovivo, B Basnar… - Japanese Journal of …, 2010 - iopscience.iop.org
We have investigated an inductively coupled plasma etching recipe using SiCl 4 and SF 6
with a resulting selectivity> 10 for GaN in respect to InAlN. The formation of an etch-resistant …

Analysis of nonselective plasma etching of AlGaN by CF4∕ Ar∕ Cl2

V Kuryatkov, B Borisov, J Saxena, SA Nikishin… - Journal of applied …, 2005 - pubs.aip.org
We report the nonselective plasma etching of epitaxial GaN: Mg, Al 0.63 Ga 0.37 N⁠, and Al
N∕ Al 0.08 Ga 0.92 N short-period superlattices with various doping properties. Etching is …

High-density plasma etch selectivity for the III–V nitrides

RJ Shul, CG Willison, MM Bridges, J Han, JW Lee… - Solid-State …, 1998 - Elsevier
High-density plasma etching has been an effective patterning technique for the group-III
nitrides due to ion fluxes which are 2–4 orders of magnitude higher than more conventional …

SELECTIVE DRY ETCHING OF GaN OVER AlGaN IN BCL3/SF6 MIXTURES

D Buttari, A Chini, A Chakraborty… - … journal of high speed …, 2004 - World Scientific
Inductively coupled plasma (ICP) etching of GaN with high selectivity over Al. 22 Ga. 78 N in
BCl 3/SF 6 mixtures has been studied. Selectivity and surface morphology were investigated …