Dynamic mode operation of Atomic Force Microscopes relies on demodulation schemes to
get information from different flexure modes of the cantilever while imaging a sample. In the …

Increasing the signal-to-noise ratio in dynamic atomic force microscopy plays a key role in
nanomechanical mapping of materials with atomic resolution. In this work, we develop an …

In typical dynamic mode operation of atomic force microscopes, steady state signals like
amplitude and phase are used for detection and imaging of material. In these methods, the …

In this paper, a method for imaging in amplitude-modulation atomic force microscopy is
developed which enables accurate sample-profile imaging even at high scanning speeds …

Higher harmonics in tapping-mode atomic force microscopy offers the potential for imaging
and sensing material properties at the nanoscale. The signal level at a given harmonic of the …

In existing dynamic mode operation of Atomic Force Microscopes (AFMs) steady-state
signals like amplitude and phase are used for detection and imaging of material. Due to the …

A fundamental challenge in dynamic mode atomic force microscopy (AFM) is the estimation
of the cantilever oscillation amplitude from the deflection signal, which might be distorted by …

While often overlooked, one of the prerequisites for high-speed amplitude modulation
atomic force microscopy is a high-bandwidth amplitude estimation technique. Conventional …

The detection of higher modes of oscillation in atomic force microscopy can provide
additional information on sample properties. However, the limited bandwidth of the …

The monitoring of the deflection of a micro-cantilever, as the end of a sharp probe mounted
at its end, ie the tip, interacts with a surface, forms the foundation of atomic force microscopy …