Accurate force determinations in atomic force microscopy require the precise measurement
of cantilever deflections. A limiting factor in making these measurements is the calibration of …

Atomic force microscopes typically require knowledge of the cantilever spring constant and
optical lever sensitivity in order to accurately determine the force from the cantilever …

Proper force calibration is a critical step in atomic and lateral force microscopies (AFM/LFM).
The recently published torsional Sader method [CP Green et al, Rev. Sci. Instrum. 75, 1988 …

We present here a method to calibrate the lateral force in the atomic force microscope. This
method makes use of an accurately calibrated force sensor composed of a tipless …

We have designed and tested a new, inexpensive, easy-to-make and easy-to-use
calibration standard for atomic force microscopy (AFM) lateral force measurements. This …

In an atomic force microscope (AFM), the force is normally sensed by measuring the
deflection of a cantilever by an optical lever technique. Experimental results show a …

Calibration of lateral forces and displacements has been a long standing problem in lateral
force microscopies. Recently, it was shown by Wagner et al. that the thermal noise spectrum …

Recently, there has been interest in increasing the throughput of scanning probe
microscopy; 1–3 however, applications such as imaging and lithography often require that …

To date, commercial atomic force microscopes have been optimized for measurements of
forces perpendicular to the sample surface. In many applications, sensitive parallel force …

Most atomic force microscopes and cantilever-based sensors use an optical laser beam
detection system to monitor cantilever deflections. We have developed a working model that …