Quantitative comparison of three calibration techniques for the lateral force microscope

RG Cain, MG Reitsma, S Biggs… - Review of scientific …, 2001 - pubs.aip.org
The quantitative use of atomic force microscopes in lateral mode for friction measurements
has been limited by uncertainty about reliable calibration techniques. This article describes …

A novel technique for the in situ calibration and measurement of friction with the atomic force microscope

J Stiernstedt, MW Rutland, P Attard - Review of Scientific Instruments, 2005 - pubs.aip.org
Presented here is a novel technique for the in situ calibration and measurement of friction
with the atomic force microscope that can be applied simultaneously with the normal force …

Lateral force microscope calibration using a modified atomic force microscope cantilever

MG Reitsma - Review of Scientific Instruments, 2007 - pubs.aip.org
A proof-of-concept study is presented for a prototype atomic force microscope (AFM)
cantilever and associated calibration procedure that provide a path for quantitative friction …

Calibration of the torsional spring constant and the lateral photodiode response of frictional force microscopes

A Feiler, P Attard, I Larson - Review of scientific instruments, 2000 - pubs.aip.org
We present a direct one-step technique to measure the torsional spring constant of
cantilevers used for lateral or friction measurements with the atomic force microscope. The …

Calibration of frictional forces in atomic force microscopy

DF Ogletree, RW Carpick, M Salmeron - Review of Scientific …, 1996 - pubs.aip.org
The atomic force microscope can provide information on the atomic‐level frictional
properties of surfaces, but reproducible quantitative measurements are difficult to obtain …

Comparison of different methods to calibrate torsional spring constant and photodetector for atomic force microscopy friction measurements in air and liquid

T Pettersson, N Nordgren, MW Rutland… - Review of Scientific …, 2007 - pubs.aip.org
A number of atomic force microscopy cantilevers have been exhaustively calibrated by a
number of techniques to obtain both normal and frictional force constants to evaluate the …

A calibration method for lateral forces for use with colloidal probe force microscopy cantilevers

MAS Quintanilla, DT Goddard - Review of Scientific Instruments, 2008 - pubs.aip.org
A calibration method is described for colloidal probe cantilevers that enables friction force
measurements obtained using lateral force microscopy (LFM) to be quantified. The method …

Lateral stiffness of the tip and tip-sample contact in frictional force microscopy

MA Lantz, SJ O'shea, ACF Hoole… - Applied physics letters, 1997 - pubs.aip.org
In atomic force and frictional force microscopy, quantitative interpretation of lateral stiffness
at the tip-sample contact requires a detailed understanding of all factors contributing to the …

Simultaneous measurement of lateral and normal forces with an optical‐beam‐deflection atomic force microscope

G Meyer, NM Amer - Applied physics letters, 1990 - pubs.aip.org
An atomic force microscope capable of measuring, simultaneously yet separately, lateral ("
frictional") and normal forces is described. A direction-dependent feature, absent in …

Force calibration in lateral force microscopy

RG Cain, S Biggs, NW Page - Journal of colloid and interface science, 2000 - Elsevier
An analysis of the contact mechanics and the forces of interaction in lateral force microscopy
measurements is presented. This analysis allows for a new method of interpretation of the …