In tapping-mode atomic force microscopy, nonlinear tip–sample interactions give rise to
higher harmonics of the cantilever vibration. We present an electrical circuit to model the …

We present an experimental analysis of the nonlinear tip–sample interaction in tapping-
mode atomic-force microscopy by exploiting anharmonic contributions of the cantilever …

Higher harmonics in tapping-mode atomic force microscopy offers the potential for imaging
and sensing material properties at the nanoscale. The signal level at a given harmonic of the …

By spectroscopic analysis of the cantilever oscillation in tapping-mode atomic-force
microscopy (TM–AFM), we demonstrate that the transition from an oscillatory state …

The periodic impact force induced by tip-sample contact in a tapping mode atomic force
microscope (AFM) gives rise to the non-harmonic response of a micro-cantilever. These non …

In tapping-mode atomic-force microscopy usually amplitude and phase of the cantilever
motion are acquired. These signals are related to the fundamental oscillation frequency …

The contribution of higher harmonics to the movement of a micro rectangular cantilever in
tapping mode AFM is investigated. The dependence between the phase lag of the higher …

The natural frequencies of a cantilever probe can be tuned with an attached concentrated
mass to coincide with the higher harmonics generated in a tapping-mode atomic force …

In this work, we study the performance of a new cantilever design during multi-frequency
tapping mode Atomic Force Microscopy (AFM). The system consists of a base cantilever with …

In a tapping-mode atomic force microscope, the frequency spectrum of the oscillating
cantilever contains higher harmonics at integer multiples of the excitation frequency. When …