A simple and precise method based on fixed-point iteration is used to estimate dielectric
parameters using terahertz time-domain spectroscopy (THz-TDS). The method converges …

The potential of terahertz (THz) time domain spectroscopy to simultaneously determine the
complex dielectric parameters of materials and their geometrical thickness is of high interest …

A simple method to extract the far-infrared dielectric parameters of a homogeneous material
from terahertz signals is explored in this paper. Provided with a reference, sample-probing …

Terahertz time domain spectroscopy allows for characterization of dielectrics even in cases
where the samples thickness is unknown. However, a parameter extraction over a broad …

The terahertz time-domain spectroscopy 1 (THz-TDS) has recently emerged as a powerful
tool in investigation of dielectrics, semiconductors, and superconductors in the far infrared …

A multiple angle technique for Terahertz (THz) time-domain material characterization is
described. In order to extract the properties of a material system, the technique utilizes the …

The accuracy of any measurement with terahertz time-domain spectroscopy (THz-TDS)
depends strongly on knowing and supplying the precise sample thickness when processing …

Terahertz time-domain spectroscopy (THz-TDS) is in many ways a well-established, proven,
and versatile spectroscopic technique that is frequently and routinely used in many …

This paper introduces a novel method that allows fast and reliable extraction of material
parameters in terahertz time-domain spectroscopy. This method could be applied for most …

Terahertz time-domain spectroscopy (THz TDS) is a well-known tool for material analysis in
the terahertz frequency band. One crucial system component in every time-domain …