The atomic force microscopy (AFM) is a very important tool for imaging and investigating the
complex force interactions on sample surfaces with high spatial resolution. In the AFM, two …

A novel atomic force microscope (AFM) has been developed. Unlike conventional AFM
systems, its cantilever and tip were set up in the X direction with respect to the sample. It can …

We developed a multi-probe atomic force microscope (MP-AFM) system with up to four
probes and realized various functions such as topography mapping, probing electrical …

In order to enhance the lateral force sensitivity of atomic force microscopy (AFM) to detect
atomic or molecular scale interaction, two types of force sensors were fabricated by …

We developed a multi-probe atomic force microscope (AFM) having two AFM cantilevers
independently controlled using the optical beam deflection method. We succeeded in …

A novel method that uses a small mechanical lever has been developed to directly calibrate
the lateral sensitivity of the optical lever in the atomic force microscope (AFM). The …

Recently, there has been interest in increasing the throughput of scanning probe
microscopy; 1–3 however, applications such as imaging and lithography often require that …

The atomic force microscope AFM is a powerful instrument in nanometer-scale science and
technology. Since its invention in 1986, 1 AFM has evolved significantly, refining its …

Calibration of lateral forces and displacements has been a long standing problem in lateral
force microscopies. Recently, it was shown by Wagner et al. that the thermal noise spectrum …

We developed a dual-probe atomic force microscopy (DP-AFM) system with two cantilever
probes that can be operated in various environments such as in air, vacuum, and liquid. The …