We present an experimental analysis of the nonlinear tip–sample interaction in tapping-
mode atomic-force microscopy by exploiting anharmonic contributions of the cantilever …

In tapping-mode atomic-force microscopy usually amplitude and phase of the cantilever
motion are acquired. These signals are related to the fundamental oscillation frequency …

In tapping-mode atomic force microscopy, nonlinear tip–sample interactions give rise to
higher harmonics of the cantilever vibration. We present an electrical circuit to model the …

By spectroscopic analysis of the cantilever oscillation in tapping-mode atomic-force
microscopy (TM–AFM), we demonstrate that the transition from an oscillatory state …

Higher harmonics in tapping-mode atomic force microscopy offers the potential for imaging
and sensing material properties at the nanoscale. The signal level at a given harmonic of the …

The natural frequencies of a cantilever probe can be tuned with an attached concentrated
mass to coincide with the higher harmonics generated in a tapping-mode atomic force …

We discuss the influence of high-order frequency components in the operation of an
amplitude modulation atomic-force microscope (AFM). A comparative study of point-mass …

Dynamic atomic force microscopy (AFM) is a standard technique for imaging and the
analysis of surfaces at the nanometre scale. In order to estimate material properties from the …

In this article tapping-mode atomic force microscope dynamics is studied. The existence of a
periodic orbit at the forcing frequency is shown under unrestrictive conditions. The dynamics …

In this work, we study the performance of a new cantilever design during multi-frequency
tapping mode Atomic Force Microscopy (AFM). The system consists of a base cantilever with …